Scanning Probe Microscopy in Nanoscience and Nanotechnology
Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), Bharat Bhushan (eds.)This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
种类:
年:
2010
出版:
1
出版社:
Springer-Verlag Berlin Heidelberg
语言:
english
页:
956
ISBN 10:
3642035345
ISBN 13:
9783642035340
系列:
NanoScience and Technology
文件:
PDF, 29.71 MB
IPFS:
,
english, 2010
因版权方投诉,本书无法下载