Optical Diagnostics for Thin Film Processing
Irving P. Herman (Auth.)''The greatest value of Optical Diagnostics for Thin Film Processing is a comprehensive reference text. I highly recommend it to anyone who wants to seriously delve into the field of thin film optical diagnostics or wants a single source book of well-organized and very high-density information on this subject.''
--William G. Breiland, Sandia National Laboratories, OPTICAL ENGINEERING.
种类:
年:
1996
出版社:
Academic Press
语言:
english
页:
784
ISBN 10:
0123420709
ISBN 13:
9780123420701
文件:
PDF, 16.47 MB
IPFS:
,
english, 1996