Materials Science in Microelectronics II. The Effects of Structure on Properties in Thin Films
E.S. Machlin (Auth.)
Content:
Acknowledgement, Page xi
Chapter I - Electrical Properties, Pages 1-56
Chapter II - Magnetic Properties, Pages 57-102
Chapter III - Optical Properties, Pages 103-134
Chapter IV - Mechanical Properties, Pages 135-168
Chapter V - Mass Transport Properties, Pages 169-187
Chapter VI - Interface and Junction Properties, Pages 189-214
Chapter VII - Defects and Properties, Pages 215-250
Index, Pages 251-255
Acknowledgement, Page xi
Chapter I - Electrical Properties, Pages 1-56
Chapter II - Magnetic Properties, Pages 57-102
Chapter III - Optical Properties, Pages 103-134
Chapter IV - Mechanical Properties, Pages 135-168
Chapter V - Mass Transport Properties, Pages 169-187
Chapter VI - Interface and Junction Properties, Pages 189-214
Chapter VII - Defects and Properties, Pages 215-250
Index, Pages 251-255
种类:
年:
2006
出版:
2. ed
出版社:
Elsevier
语言:
english
页:
255
ISBN 10:
0080446396
ISBN 13:
9780080446394
文件:
PDF, 2.16 MB
IPFS:
,
english, 2006